View CY7C1360V25_196894.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

PRELIMINARY
CY7C1360V25 CY7C1362V25 CY7C1364V25
256K x 36/256K x 32/512K x 18 Pipelined SRAM
Features
* Supports 200-MHz bus * Fully registered inputs and outputs for pipelined operation * Single 2.5V power supply * Fast clock-to-output times -- 3.1 ns (for 200-MHz device) -- 3.5 ns (for 166-MHz device) -- 4.0 ns (for 133-MHz device -- 5.0 ns (for 100-MHz device * User-selectable burst counter supporting Intel(R) Pentium(R) interleaved or linear burst sequences * Separate processor and controller address strobes * Synchronous self-timed writes * Asynchronous output enable * Available as a 100-pin TQFP or 119 BGA * "ZZ" Sleep Mode option and Stop Clock option All synchronous inputs pass through input registers controlled by the rising edge of the clock. All data outputs pass through output registers controlled by the rising edge of the clock. Maximum access delay from the clock rise is 3.1 ns (200-MHz device). The CY7C1360V25/CY7C1364V25/CY7C1362V25 supports either the interleaved burst sequence used by the Intel Pentium processor or a linear burst sequence used by processors such as the PowerPCTM. The burst sequence is selected through the MODE pin. Accesses can be initiated by asserting either the Processor Address Strobe (ADSP) or the Controller Address Strobe (ADSC) at clock rise. Address advancement through the burst sequence is controlled by the ADV input. A 2-bit on-chip wraparound burst counter captures the first address in a burst sequence and automatically increments the address for the rest of the burst access. Byte write operations are qualified with the Byte Write Select (BWa,b,c,d for 1360V25/1364V25 and BWa,b for 1362V25) inputs. A Global Write Enable (GW) overrides all byte write inputs and writes data to all four bytes. All writes are conducted with on-chip synchronous self-timed write circuitry. Three synchronous Chip Selects (CE1, CE2, CE3) and an asynchronous Output Enable (OE) provide for easy bank selection and output three-state control. In order to provide proper data during depth expansion, OE is masked during the first clock of a read cycle when emerging from a deselected state.
Functional Description
The CY7C1360V25, CY7C1364V25 and CY7C1362V25 are 2.5V, 256K x 36, 256K x 32 and 512K x 18 synchronous-pipelined cache SRAM, respectively. They are designed to support zero wait state secondary cache with minimal glue logic.
Logic Block Diagram
CLK CE ADV Ax GW CE1 CE2 CE3 BWE BWx MODE ADSP ADSC ZZ OE 1360V25 A[17:0] DQa,b,c,d DPa,b,c,d BWa,b,c,d 1362V25 A[18:0] DQa,b DPa,b BWa,b 1364V25 A[18:0] DQa,b NC BWa,b CONTROL and WRITE LOGIC 256Kx36/ 512Kx18 MEMORY ARRAY D Data-In REG. Q CLK OOUTPUT REGISTERS and LOGIC
DQx DPx
AX DQX DPX BWX
Intel and Pentium are registered trademarks of Intel Corporation. PowerPC is a trademark of IBM Corporation.
Cypress Semiconductor Corporation
*
3901 North First Street
*
San Jose
*
CA 95134
* 408-943-2600 December 3, 1999
PRELIMINARY
Pin Configurations
100-Pin TQFP
CY7C1360V25 CY7C1362V25 CY7C1364V25
A A CE 1 CE 2 BWd BWc BWb BWa CE 3 V DD V SS CLK GW BWE OE ADSC ADSP ADV A A
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
NC,DQPc DQc DQc VDDQ VSSQ DQc DQc DQc DQc VSSQ VDDQ DQc DQc VDD VDD NC VSS DQd DQd VDDQ VSSQ DQd DQd DQd DQd VSSQ VDDQ DQd DQd NC,DQPd
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
CY7C1360/1364 (256K X 36/256K x 32)
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
NC,DQPb DQb DQb VDDQ VSSQ DQb DQb DQb DQb VSSQ VDDQ DQb DQb VSS NC VDD ZZ DQa DQa VDDQ VSSQ DQa DQa DQa DQa VSSQ VDDQ DQa DQa NC,DQPa
NC NC NC VDDQ VSSQ NC NC DQb DQb VSSQ VDDQ DQb DQb VDD VDD NC VSS DQb DQb VDDQ VSSQ DQb DQb DPb NC VSSQ VDDQ NC NC NC
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
A A CE 1 CE 2 NC NC BWb BWa CE 3 VDD VSS CLK GW BWE OE ADSC ADSP ADV A A
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
CY7C1362 (512K x 18)
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
A NC NC VDDQ VSSQ NC DPa DQa DQa VSSQ VDDQ DQa DQa VSS NC VDD ZZ DQa DQa VDDQ VSSQ DQa DQa NC NC VSSQ VDDQ NC NC NC
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
MODE A A A A A1 A0 DNU DNU V SS V DD
DNU A A A A A A A A
MODE A A A A A1 A0 DNU DNU V SS V DD
2
DNU A A A A A A A A
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
PRELIMINARY
Pin Configurations (continued)
119-Ball BGA 1 A B C D E F G H J K L M N P R T U VDDQ NC NC DQc DQc VDDQ DQc DQc VDDQ DQd DQd VDDQ DQd DQd NC NC VDDQ CY7C1360/1364 (256K x 36/256K x 32) 2 3 4 5 A CE2 A NC,DQPc DQc DQc DQc DQc VDD DQd DQd DQd DQd NC,DQPd A NC TMS A A A VSS VSS VSS BWc VSS NC VSS BWd VSS VSS VSS MODE A TDI ADSP ADSC VDD NC CE1 OE ADV GW VDD CLK NC BWE A1 A0 VDD A TCK A A A VSS VSS VSS BWb VSS NC VSS BWa VSS VSS VSS VDD A TDO 6 A A A NC,DQPb DQb DQb DQb DQb VDD DQa DQa DQa DQa NC,DQPa A NC DNU 7 VDDQ NC NC DQb DQb VDDQ DQb DQb VDDQ DQa DQa VDDQ DQa DQa NC ZZ VDDQ
CY7C1360V25 CY7C1362V25 CY7C1364V25
CY7C1362 (512K x 18) 1 A B C D E F G H J K L M N P R T U VDDQ NC NC DQb NC VDDQ NC DQb VDDQ NC DQb VDDQ DQb NC NC NC VDDQ 2 A CE2 A NC DQb NC DQb NC VDD DQb NC DQb NC DQPb A A TMS 3 A A A VSS VSS VSS BWb VSS NC VSS VSS VSS VSS VSS MODE A TDI 4 ADSP ADSC VDD NC CE1 OE ADV GW VDD CLK NC BWE A1 A0 Vdd NC TCK 5 A A A VSS VSS VSS VSS VSS NC VSS BWa VSS VSS VSS VDD A TDO 6 A A A DQPa NC DQa NC DQd VDD NC DQa NC DQa NC A A DNU 7 VDDQ NC NC NC DQ a VDDQ DQ a NC VDDQ DQ a NC VDDQ NC DQ a NC ZZ VDDQ
3
PRELIMINARY
Selection Guide
CY7C1360V25 CY7C1362V25 CY7C1364V25
7C1360V25-200 7C1360V25-166 7C1360V25-133 7C1360V25-100 7C1364V25-200 7C1364V25-166 7C1364V25-133 7C1364V25-100 7C1362V25-200 7C1362V25-166 7C1362V25-133 7C1362V25-100 Maximum Access Time (ns) Maximum Operating Current (mA) Maximum CMOS Standby Current (mA) Commercial 3.1 450 10 3.5 400 10 4.0 350 10 5.0 325 10
Pin Definitions (100-Pin TQFP)
x18 Pin Locations x36 Pin Locations 37, 36, 32-25, 37, 36, 32-35, 43-50, 80-82, 99, 43-50, 81, 82, 99, 100 100 Name A0 A1 A I/O InputSynchronous Description Address Inputs used to select one of the address locations. Sampled at the rising edge of the CLK if ADSP or ADSC is active LOW, and CE1, CE2, and CE3 are sampled active. A[1:0] feed the 2-bit counter. Byte Write Select Inputs, active LOW. Qualified with BWE to conduct byte writes to the SRAM. Sampled on the rising edge of CLK. Global Write Enable Input, active LOW. When asserted LOW on the rising edge of CLK, a global write is conducted (ALL bytes are written, regardless of the values on BWa,b,c,d and BWE). Byte Write Enable Input, active LOW. Sampled on the rising edge of CLK. This signal must be asserted LOW to conduct a byte write. Clock Input. Used to capture all synchronous inputs to the device. Also used to increment the burst counter when ADV is asserted LOW, during a burst operation. Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2 and CE3 to select/deselect the device. ADSP is ignored if CE1 is HIGH. Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE3 to select/deselect the device. Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE2 to select/deselect the device. Output Enable, asynchronous input, active LOW. Controls the direction of the I/O pins. When LOW, the I/O pins behave as outputs. When deasserted HIGH, I/O pins are three-stated, and act as input data pins. OE is masked during the first clock of a read cycle when emerging from a deselected state. Advance Input signal, sampled on the rising edge of CLK. When asserted, it automatically increments the address in a burst cycle. Address Strobe from Processor, sampled on the rising edge of CLK. When asserted LOW, A is captured in the address registers. A[1:0] are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized. ASDP is ignored when CE1 is deasserted HIGH.
93, 94
93, 94, 95, 96,
88
88
BWa BWb BWc BWd GW
InputSynchronous
InputSynchronous
87
87
BWE
InputSynchronous Input-Clock
89
89
CLK
98
98
CE1
InputSynchronous
97
97
CE2
InputSynchronous InputSynchronous InputAsynchronous
92
92
CE3
86
86
OE
83
83
ADV
InputSynchronous InputSynchronous
84
84
ADSP
4
PRELIMINARY
Pin Definitions (100-Pin TQFP) (continued)
x18 Pin Locations x36 Pin Locations 85 85 Name ADSC I/O InputSynchronous
CY7C1360V25 CY7C1362V25 CY7C1364V25
31
31
MODE
InputStatic
64
64
ZZ
InputAsynchronous I/OSynchronous
(a) 58, 59, 62, 63, 68, 69, 72, 73 (b) 8, 9, 12, 13, 18, 19, 22, 23
(a) 52, 53, 56-59, 62, 63 (b) 68, 69, 72-75, 78, 79 (c) 2, 3, 6-9, 12, 13 (d) 18, 19, 22-25, 28, 29
DQa DQb DQc DQd
74, 24
51, 80, 1, 30
NC,DQPa NC,DQPb NC,DQPc NC,DQPd
I/OSynchronous
15, 41, 65, 91 17, 40, 67, 90 4, 11, 20, 27, 54, 61, 70, 77 5, 10, 21, 26, 55, 60, 71, 76 1, 2, 3, 6, 7, 14, 16, 25, 28, 29, 30, 51, 52, 53, 56, 57, 66, 75, 78, 79, 95, 96 42 38, 39
15, 41, 65, 91 17, 40, 67, 90 4, 11, 20, 27, 54, 61, 70, 77 5, 10, 21, 26, 55, 60, 71, 76 16, 66
VDD VSS VDDQ VSSQ NC
Power Supply Ground I/O Power Supply I/O Ground -
Description Address Strobe from Controller, sampled on the rising edge of CLK. When asserted LOW, A[x:0] is captured in the address registers. A[1:0] are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized. Selects Burst Order. When tied to GND selects linear burst sequence. When tied to VDDQ or left floating selects interleaved burst sequence. This is a strap pin and should remain static during device operation. ZZ "sleep" Input. This active HIGH input places the device in a non-time critical "sleep" condition with data integrity preserved. Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by A during the previous clock rise of the read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs. When HIGH, DQa and DPa are placed in a three-state condition. Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by A during the previous clock rise of the read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs. When HIGH, DQx and DPx are placed in a three-state condition. These are not connect pins on the CY7C1364. Power supply inputs to the core of the device. Should be connected to 2.5V power supply. Ground for the core of the device. Should be connected to ground of the system. Power supply for the I/O circuitry. Should be connected to a 2.5V power supply. Ground for the I/O circuitry. Should be connected to ground of the system. No Connects.
42 38, 39
DNU DNU
Do Not Use Pin. This pin is used for the expansion to the 16M density. Do Not Use Pins. These pins should be left floating or tied to VSS.
5
PRELIMINARY
Pin Definitions (119-Ball BGA)
x18 Pin Locations 4P, 4N, 2A, 3A, 5A, 6A, 3B, 5B, 2C, 3C, 5C, 6C, 2R, 6R, 2T, 3T, 5T, 6B, 6T 5L, 3G x36 Pin Locations 4P, 4N, 2A, 2C, 2R, 3A, 3B, 3C, 3T, 4T, 5A, 5B, 5C, 5T, 6A, 6B, 6C, 6R 5L, 5G, 3G, 3L Name A0 A1 A I/O InputSynchronous
CY7C1360V25 CY7C1362V25 CY7C1364V25
Description Address Inputs used to select one of the address locations. Sampled at the rising edge of the CLK if ADSP or ADSC is active LOW, and CE1, CE 2, and CE3 are sampled active. A [1:0] feed the 2-bit counter. Byte Write Select Inputs, active LOW. Qualified with BWE to conduct byte writes to the SRAM. Sampled on the rising edge of CLK. Global Write Enable Input, active LOW. When asserted LOW on the rising edge of CLK, a global write is conducted (ALL bytes are written, regardless of the values on BWa,b,c,d and BWE). Byte Write Enable Input, active LOW. Sampled on the rising edge of CLK. This signal must be asserted LOW to conduct a byte write. Clock Input. Used to capture all synchronous inputs to the device. Also used to increment the burst counter when ADV is asserted LOW, during a burst operation. Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE 2 and CE3 to select/deselect the device. ADSP is ignored if CE1 is HIGH. Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE3 to select/deselect the device. This pin is also used for expansion to a 16M density SRAM. Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE2 to select/deselect the device. Output Enable, asynchronous input, active LOW. Controls the direction of the I/O pins. When LOW, the I/O pins behave as outputs. When deasserted HIGH, I/O pins are three-stated, and act as input data pins. OE is masked during the first clock of a read cycle when emerging from a deselected state. Advance Input signal, sampled on the rising edge of CLK. When asserted, it automatically increments the address in a burst cycle. Address Strobe from Processor, sampled on the rising edge of CLK. When asserted LOW, A is captured in the address registers. A[1:0] are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized. ASDP is ignored when CE1 is deasserted HIGH. Address Strobe from Controller, sampled on the rising edge of CLK. When asserted LOW, A[x:0] is captured in the address registers. A[1:0] are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized.
BWa BWb BWc BWd GW
InputSynchronous
4M
4M
InputSynchronous
4H
4H
BWE
InputSynchronous Input-Clock
4K
4K
CLK
4E
4E
CE1
InputSynchronous
97
97
CE2
InputSynchronous
92
92
CE3
InputSynchronous InputAsynchronous
4F
4F
OE
4G
4G
ADV
InputSynchronous InputSynchronous
4A
4A
ADSP
4B
4B
ADSC
InputSynchronous
6
PRELIMINARY
Pin Definitions (119-Ball BGA) (continued)
x18 Pin Locations 3R x36 Pin Locations 3R Name MODE I/O InputStatic
CY7C1360V25 CY7C1362V25 CY7C1364V25
Description Selects Burst Order. When tied to GND selects linear burst sequence. When tied to VDDQ or left floating selects interleaved burst sequence. This is a strap pin and should remain static during device operation. ZZ "sleep" Input. This active HIGH input places the device in a non-time critical "sleep" condition with data integrity preserved. Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by A during the previous clock rise of the read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs. When HIGH, DQ x and DQPx are placed in a three-state condition. Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK. Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK. This pin controls the Test Access Port state machine. Sampled on the rising edge of TCK. Clock input to the JTAG circuitry. Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by A during the previous clock rise of the read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs. When HIGH, DQx and DPx are placed in a three-state condition. These are not connect pins on the CY7C1364 Power supply inputs to the core of the device. Should be connected to 2.5V power supply. Ground for the device. Should be connected to ground of the system.
7T
7T
ZZ
InputAsynchronous I/OSynchronous
(a) 6F, 6H, 6L, 6N, 7E, 7G, 7K, 7P (b) 1D, 1H, 1L, 1N, 2E, 2G, 2K, 2M
(a) 6K, 6L, 6M, 6N, 7K, 7L, 7N, 7P (b) 6E, 6F, 6G, 6H, 7D, 7E, 7G, 7H (c) 1D, 1E, 1G, 1H, 2E, 2F, 2G, 2H (d) 1K, 1L, 1N, 1P, 2K, 2L, 2M, 2N U5
DQa DQb DQc DQd
U5
TDO
JTAG Serial Output Synchronous JTAG Serial Input Synchronous Test Mode Select Synchronous JTAG-Clock I/OSynchronous
U3
U3
TDI
U2
U2
TMS
U4 6D, 2P
U4 6P, 6D, 2D, 2P
TCK NC,DQPa NC,DQPb NC,DQPc NC,DQPd
2J, 4C, 4J, 4R, 5R, 6J 3D, 3E, 3F, 3H, 3K, 3M, 3N, 3P, 5D, 5E, 5F, 5H, 5K, 5M, 5N, 5P 1A, 1F, 1J, 1M, 1U, 7A, 7F, 7J, 7M, 7U
2J, 4C, 4J, 4R, 5R, 6J VDD 3D, 3E, 3F, 3H, 3K, 3M, 3N, 3P, 5D, 5E, 5F, 5H, 5K, 5M, 5N, 5P 1A, 1F, 1J, 1M, 1U, 7A, 7F, 7J, 7M, 7U VSS
Power Supply Ground
VDDQ NC
I/O Power Supply -
Power supply for the I/O circuitry. Should be connected to a 2.5V power supply. No Connects.
1B, 1C, 1E, 1G, 1K, 1B, 1C, 1R, 1T, 2T, 1P, 1R, 1T, 2D, 2F, 3J, 4D, 4L, 5J, 6T, 7B, 2H, 2L, 2N, 3J, 4D, 7C, 7R 4L, 4T, 5J, 6E, 6G, 6K, 6M, 6P, 7B, 7C, 7D, 7H, 7L, 7N, 7R 6U 6U
DNU
Do Not Use Pins. These pins should be left floating.
7
PRELIMINARY
Introduction
Functional Overview All synchronous inputs pass through input registers controlled by the rising edge of the clock. All data outputs pass through output registers controlled by the rising edge of the clock. Maximum access delay from the clock rise (tCO) is 3.1 ns (200-MHz device). The CY7C1360V25/CY7C1364V25/CY7C1362V25 supports secondary cache in systems utilizing either a linear or interleaved burst sequence. The interleaved burst order supports Pentium and i486 processors. The linear burst sequence is suited for processors that utilize a linear burst sequence. The burst order is user selectable, and is determined by sampling the MODE input. Accesses can be initiated with either the Processor Address Strobe (ADSP) or the Controller Address Strobe (ADSC). Address advancement through the burst sequence is controlled by the ADV input. A two-bit on-chip wraparound burst counter captures the first address in a burst sequence and automatically increments the address for the rest of the burst access. Byte write operations are qualified with the Byte Write Enable (BWE) and Byte Write Select (BWa,b,c,d for CY7C1360V25/ CY7C1364V25 and BWa,b for CY7C1362V25) inputs. A Global Write Enable (GW) overrides all byte write inputs and writes data to all four bytes. All writes are simplified with on-chip synchronous self-timed write circuitry. Three synchronous Chip Selects (CE1, CE2, CE3) and an asynchronous Output Enable (OE) provide for easy bank selection and output three-state control. ADSP is ignored if CE1 is HIGH. Single Read Accesses This access is initiated when the following conditions are satisfied at clock rise: (1) ADSP or ADSC is asserted LOW, (2) CE1, CE2, CE3 are all asserted active, and (3) the write signals (GW, BWE) are all deasserted HIGH. ADSP is ignored if CE1 is HIGH. The address presented to the address inputs is stored into the address advancement logic and the Address Register while being presented to the memory core. The corresponding data is allowed to propagate to the input of the Output Registers. At the rising edge of the next clock the data is allowed to propagate through the output register and onto the data bus within 3.1 ns (200-MHz device) if OE is active LOW. The only exception occurs when the SRAM is emerging from a deselected state to a selected state; its outputs are always three-stated during the first cycle of the access. After the first cycle of the access, the outputs are controlled by the OE signal. Consecutive single read cycles are supported. Once the SRAM is deselected at clock rise by the chip select and either ADSP or ADSC signals, its output will three-state immediately. Single Write Accesses Initiated by ADSP This access is initiated when both of the following conditions are satisfied at clock rise: (1) ADSP is asserted LOW, and (2) CE1, CE2, CE3 are all asserted active. The address presented
CY7C1360V25 CY7C1362V25 CY7C1364V25
is loaded into the address register and the address advancement logic while being delivered to the RAM core. The write signals (GW, BWE, and BWx) and ADV inputs are ignored during this first cycle. ADSP triggered write accesses require two clock cycles to complete. If GW is asserted LOW on the second clock rise, the data presented to the DQ x inputs is written into the corresponding address location in the RAM core. If GW is HIGH, then the write operation is controlled by BWE and BWx signals. The CY7C1360V25/1364V25/1362V25 provides byte write capability that is described in the Write Cycle Description table. Asserting the Byte Write Enable input (BWE) with the selected Byte Write ( BWa,b,c,d for CY7C1360V25/1364V25 & BWa,b for CY7C1362V25) input will selectively write to only the desired bytes. Bytes not selected during a byte write operation will remain unaltered. A synchronous self-timed write mechanism has been provided to simplify the write operations. Because the CY7C1360V25/CY7C1364V25/CY7C1362V25 is a common I/O device, the Output Enable (OE) must be deasserted HIGH before presenting data to the DQ inputs. Doing so will three-state the output drivers. As a safety precaution, DQ are automatically three-stated whenever a write cycle is detected, regardless of the state of OE. Single Write Accesses Initiated by ADSC ADSC write accesses are initiated when the following conditions are satisfied: (1) ADSC is asserted LOW, (2) ADSP is deasserted HIGH, (3) CE1, CE2, CE3 are all asserted active, and (4) the appropriate combination of the write inputs (GW, BWE, and BWx) are asserted active to conduct a write to the desired byte(s). ADSC triggered write accesses require a single clock cycle to complete. The address presented to A[17:0] is loaded into the address register and the address advancement logic while being delivered to the RAM core. The ADV input is ignored during this cycle. If a global write is conducted, the data presented to the DQ[x:0] is written into the corresponding address location in the RAM core. If a byte write is conducted, only the selected bytes are written. Bytes not selected during a byte write operation will remain unaltered. A synchronous self-timed write mechanism has been provided to simplify the write operations. Because the CY7C1360V25/CY7C1364V25/CY7C1362V25 is a common I/O device, the Output Enable (OE) must be deasserted HIGH before presenting data to the DQ[x:0] inputs. Doing so will three-state the output drivers. As a safety precaution, DQ[x:0] are automatically three-stated whenever a write cycle is detected, regardless of the state of OE.
Burst Sequences
The CY7C1360V25/CY7C1364V25/CY7C1362V25 provides a two-bit wraparound counter, fed by A[1:0], that implements either an interleaved or linear burst sequence. The interleaved burst sequence is designed specifically to support Intel Pentium applications. The linear burst sequence is designed to support processors that follow a linear burst sequence. The burst sequence is user selectable through the MODE input.
8
PRELIMINARY
Asserting ADV LOW at clock rise will automatically increment the burst counter to the next address in the burst sequence. Both read and write burst operations are supported.
CY7C1360V25 CY7C1362V25 CY7C1364V25
Linear Burst Sequence
First Address A[1:0] 00 01 10 11 Sleep Mode The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation "sleep" mode. Two clock cycles are required to enter into or exit from this "sleep" mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the "sleep" mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected prior to entering the "sleep" mode. CE 1, CE2, CE3, ADSP, and ADSC must remain inactive for the duration of tZZREC after the ZZ input returns LOW. Second Address A[1:0] 01 10 11 00 Third Address A[1:0] 10 11 00 01 Fourth Address A[1:0] 11 00 01 10
Interleaved Burst Sequence
First Address A[1:0]] 00 01 10 11 Second Address A[1:0] 01 00 11 10 Third Address A[1:0] 10 11 00 01 Fourth Address A[1:0] 11 10 01 00
ZZ Mode Electrical Characteristics
Parameter IDDZZ tZZS tZZREC Description Snooze mode standby current Device operation to ZZ ZZ recovery time Test Conditions ZZ > VDD - 0.2V ZZ > VDD - 0.2V ZZ < 0.2V 2tCYC Min Max 15 2tCYC Unit mA ns ns
9
PRELIMINARY
Cycle Description[1, 2, 3]
Next Cycle Unselected Unselected Unselected Unselected Unselected Begin Read Begin Read Continue Read Continue Read Continue Read Continue Read Suspend Read Suspend Read Suspend Read Suspend Read Begin Write Begin Write Begin Write Continue Write Continue Write Suspend Write Suspend Write ZZ "sleep" Add. Used None None None None None External External Next Next Next Next Current Current Current Current Current Current External Next Next Current Current None ZZ L L L L L L L L L L L L L L L L L L L L L L H CE3 X 1 X 1 X 0 0 X X X X X X X X X X 0 X X X X X CE2 X X 0 X 0 1 1 X X X X X X X X X X 1 X X X X X CE1 1 0 0 0 0 0 0 X X 1 1 X X 1 1 X 1 0 X 1 X 1 X ADSP X 0 0 1 1 0 1 1 1 X X 1 1 X X 1 X 1 1 X 1 X X ADSC 0 X X 0 0 X 0 1 1 1 1 1 1 1 1 1 1 0 1 1 1 1 X ADV X X X X X X X 0 0 0 0 1 1 1 1 1 1 X 0 0 1 1 X
CY7C1360V25 CY7C1362V25 CY7C1364V25
OE X X X X X X X 1 0 1 0 1 0 1 0 X X X X X X X X
DQ Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z DQ Hi-Z DQ Hi-Z DQ Hi-Z DQ Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z
Write X X X X X X Read Read Read Read Read Read Read Read Read Write Write Write Write Write Write Write X
Note: 1. X = "don't care," 1 = HIGH, 0 = LOW. 2. Write is defined by BWE, BWx, and GW. See Write Cycle Description table. 3. The DQ pins are controlled by the current cycle and the OE signal. OE is asynchronous and is not sampled with the clock.
10
PRELIMINARY
Write Cycle Description[1, 2, 3]
Function (1360/1364) Read Read Write Byte 0-DQa Write Byte 1-DQb Write Bytes 1, 0 Write Byte 2 - DQc Write Bytes 2, 0 Write Bytes 2, 1 Write Bytes 2, 1, 0 Write Byte 3 - DQd Write Bytes 3, 0 Write Bytes 3, 1 Write Bytes 3, 1, 0 Write Bytes 3, 2 Write Bytes 3, 2, 0 Write Bytes 3, 2, 1 Write All Bytes Write All Bytes Function (1362) Read Read Write Byte 0 - DQ[7:0] and DP0 Write Byte 1 - DQ[15:8] and DP1 Write All Bytes Write All Bytes GW 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 0 GW 1 1 1 1 1 0 BWE 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 X BWd X 1 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0 X BWE 1 0 0 0 0 X BWc X 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 X BWb X 1 1 0 0 X
CY7C1360V25 CY7C1362V25 CY7C1364V25
BWb X 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 X
BWa X 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 X BWa X 1 0 1 0 X
11
PRELIMINARY
IEEE 1149.1 Serial Boundary Scan (JTAG)
The CY7C1360/62 incorporates a serial boundary scan Test Access Port (TAP) in the FBGA package only. The TQFP package does not offer this functionality. This port operates in accordance with IEEE Standard 1149.1-1900, but does not have the set of functions required for full 1149.1 compliance. These functions from the IEEE specification are excluded because their inclusion places an added delay in the critical speed path of the SRAM. Note that the TAP controller functions in a manner that does not conflict with the operation of other devices using 1149.1 fully compliant TAPs. The TAP operates using JEDEC standard 2.5V I/O logic levels. Disabling the JTAG Feature It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull-up resistor. TDO should be left unconnected. Upon power-up, the device will come up in a reset state which will not interfere with the operation of the device. Test Access Port (TAP) - Test Clock The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. Test Mode Select The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. It is allowable to leave this pin unconnected if the TAP is not used. The pin is pulled up internally, resulting in a logic HIGH level. Test Data-In (TDI) The TDI pin is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. For information on loading the instruction register, see the TAP Controller State Diagram. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the Most Significant Bit (MSB) on any register. Test Data Out (TDO) The TDO output pin is used to serially clock data-out from the registers. The output is active depending upon the current state of the TAP state machine (see TAP Controller State Diagram). The output changes on the falling edge of TCK. TDO is connected to the Least Significant Bit (LSB) of any register. Performing a TAP Reset A Reset is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating. At power-up, the TAP is reset internally to ensure that TDO comes up in a high-Z state. TAP Registers Registers are connected between the TDI and TDO pins and allow data to be scanned into and out of the SRAM test circuit-
CY7C1360V25 CY7C1362V25 CY7C1364V25
ry. Only one register can be selected at a time through the instruction registers. Data is serially loaded into the TDI pin on the rising edge of TCK. Data is output on the TDO pin on the falling edge of TCK. Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO pins as shown in the TAP Controller Block Diagram. Upon power-up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. When the TAP controller is in the CaptureIR state, the two least significant bits are loaded with a binary "01" pattern to allow for fault isolation of the board level serial test path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain states. The bypass register is a single-bit register that can be placed between TDI and TDO pins. This allows data to be shifted through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. Boundary Scan Register The boundary scan register is connected to all the input and output pins on the SRAM. Several no connect (NC) pins are also included in the scan register to reserve pins for higher density devices. The x36 configuration has a xx-bit-long register, and the x18 configuration has a yy-bit-long register. The boundary scan register is loaded with the contents of the RAM Input and Output ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO pins when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD and SAMPLE Z instructions can be used to capture the contents of the Input and Output ring. The Boundary Scan Order tables show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI, and the LSB is connected to TDO. Identification (ID) Register The ID register is loaded with a vendor-specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in the Identification Register Definitions table. TAP Instruction Set Eight different instructions are possible with the three-bit instruction register. All combinations are listed in the Instruction Code table. Three of these instructions are listed as RESERVED and should not be used. The other five instructions are described in detail below. The TAP controller used in this SRAM is not fully compliant to the 1149.1 convention because some of the mandatory 1149.1 instructions are not fully implemented. The TAP controller cannot be used to load address, data or control signals into the
12
PRELIMINARY
SRAM and cannot preload the Input or Output buffers. The SRAM does not implement the 1149.1 commands EXTEST or INTEST or the PRELOAD portion of SAMPLE / PRELOAD; rather it performs a capture of the Inputs and Output ring when these instructions are executed. Instructions are loaded into the TAP controller during the Shift-IR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the instruction register through the TDI and TDO pins. To execute the instruction once it is shifted in, the TAP controller needs to be moved into the Update-IR state. EXTEST EXTEST is a mandatory 1149.1 instruction which is to be executed whenever the instruction register is loaded with all 0s. EXTEST is not implemented in the TAP controller, and therefore this device is not compliant to the 1149.1 standard. The TAP controller does recognize an all-0 instruction. When an EXTEST instruction is loaded into the instruction register, the SRAM responds as if a SAMPLE / PRELOAD instruction has been loaded. There is one difference between the two instructions. Unlike the SAMPLE / PRELOAD instruction, EXTEST places the SRAM outputs in a High-Z state. IDCODE The IDCODE instruction causes a vendor-specific, 32-bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO pins and allows the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction is loaded into the instruction register upon power-up or whenever the TAP controller is given a test logic reset state. SAMPLE Z The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO pins when the TAP controller is in a Shift-DR state. It also places all SRAM outputs into a High-Z state. SAMPLE / PRELOAD SAMPLE / PRELOAD is a 1149.1 mandatory instruction. The PRELOAD portion of this instruction is not implemented, so the TAP controller is not fully 1149.1 compliant.
CY7C1360V25 CY7C1362V25 CY7C1364V25
When the SAMPLE / PRELOAD instructions are loaded into the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. The user must be aware that the TAP controller clock can only operate at a frequency up to 10 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output will undergo a transition. The TAP may then try to capture a signal while in transition (metastable state). This will not harm the device, but there is no guarantee as to the value that will be captured. Repeatable results may not be possible. To guarantee that the boundary scan register will capture the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller's capture set-up plus hold times (tCS and tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE / PRELOAD instruction. If this is an issue, it is still possible to capture all other signals and simply ignore the value of the CK and CK# captured in the boundary scan register. Once the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. Note that since the PRELOAD part of the command is not implemented, putting the TAP into the Update to the Update-DR state while performing a SAMPLE / PRELOAD instruction will have the same effect as the Pause-DR command. Bypass When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO pins. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. Reserved These instructions are not implemented but are reserved for future use. Do not use these instructions.
13
PRELIMINARY
TAP Controller State Diagram
CY7C1360V25 CY7C1362V25 CY7C1364V25
1
TEST-LOGIC RESET 1 SELECT IR-SCAN 0 1 CAPTURE-DR 0 SHIFT-DR 1 EXIT1-DR 0 PAUSE-DR 1 0 EXIT2-DR 1 UPDATE-DR 1 0 0 EXIT2-IR 1 UPDATE-IR 1 0 0 1 0 CAPTURE-DR 0 SHIFT-IR 1 EXIT1-IR 0 PAUSE-IR 1 0 1 0
0
TEST-LOGIC/ IDLE
1
SELECT DR-SCAN 0 1
1
Note: The 0/1 next to each state represents the value at TMS at the rising edge of TCK.
14
PRELIMINARY
TAP Controller Block Diagram
CY7C1360V25 CY7C1362V25 CY7C1364V25
0 Bypass Register Selection Circuitry TDI Selection Circuitry TDO
2 Instruction Register
1
0
31 30
29
.
.
2
1
0
Identification Register
x
.
.
.
.
2
1
0
Boundary Scan Register
TCK TAP Controller TMS
TAP Electrical Characteristics Over the Operating Range[4, 5]
Parameter VOH1 VOH2 VOL1 VOL2 VIH VIL IX
4. 5.
Description Output HIGH Voltage Output HIGH Voltage Output LOW Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Input Load Current IOH = -2.0 mA IOH = -100 mA IOL = 2.0 mA IOL = 100 mA
Test Conditions
Min. 1.7 2.1
Max.
Unit V V
0.7 0.2 1.7 -0.3 VDD+0.3 0.7 5
V V V V mA
GND < VI < VDDQ
-5
All Voltage referenced to Ground. Overshoot: VIH(AC)15
PRELIMINARY
TAP AC Switching Characteristics Over the Operating Range[6, 7]
Parameters tTCYC tTF tTH tTL Set-up Times tTMSS tTDIS tCS Hold Times tTMSH tTDIH tCH Output Times tTDOV tTDOX TCK Clock LOW to TDO Valid TCK Clock LOW to TDO Invalid 0 TMS Hold after TCK Clock Rise TDI Hold after Clock Rise Capture Hold after Clock Rise 10 10 10 TMS Set-up to TCK Clock Rise TDI Set-up to TCK Clock Rise Capture Set-up to TCK Rise 10 10 10 TCK Clock Cycle Time TCK Clock Frequency TCK Clock HIGH TCK Clock LOW 40 40 Description Min. 100
CY7C1360V25 CY7C1362V25 CY7C1364V25
Max. 10
Unit ns MHz ns ns ns ns ns ns ns ns
20
ns ns
Notes: 6. t CS and t CH refer to the set-up and hold time requirements of latching data from the boundary scan register. 7. Test conditions are specified using the load in TAP AC test conditions. tR/tF= 1 ns.
16
PRELIMINARY
TAP Timing and Test Conditions
CY7C1360V25 CY7C1362V25 CY7C1364V25
1.25V 50 TDO Z0 =50 CL =20 pF 0V ALL INPUT PULSES 2.5V 1.25V
GND
(a)
tTH
tTL
Test Clock TCK
tTMSS tTMSH
tTCYC
Test Mode Select TMS
tTDIS tTDIH
Test Data-In TDI
Test Data-Out TDO
tTDOX
tTDOV
17
PRELIMINARY
Identification Register Definitions
Instruction Field Revision Number (31:28) Device Depth (27:23) Device Width (22:18) Cypress Device ID (17:12) Cypress JEDEC ID (11:1) ID Register Presence (0) TBD TBD TBD TBD TBD TBD Value Description Reserved for version number. Defines depth of SRAM. Defines with of the SRAM. Reserved for future use.
CY7C1360V25 CY7C1362V25 CY7C1364V25
Allows unique identification of SRAM vendor. Indicate the presence of an ID register.
Scan Register Sizes
Register Name Instruction Bypass ID Boundary Scan 3 1 32 TBD Bit Size
Identification Codes
Instruction EXTEST 000 Code Description Captures the Input/Output ring contents. Places the boundary scan register between the TDI and TDO. Forces all SRAM outputs to High-Z state. This instruction is not 1149.1 compliant. Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operation. Captures the Input/Output contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a High-Z state. Do Not Use: This instruction is reserved for future use. Captures the Input/Output ring contents. Places the boundary scan register between TDI and TDO. Does not affect the SRAM operation. This instruction does not implement 1149.1 preload function and is therefore not 1149.1 compliant. Do Not Use: This instruction is reserved for future use. Do Not Use: This instruction is reserved for future use. Places the bypass register between TDI and TDO. This operation does not affect SRAM operation.
IDCODE SAMPLE Z RESERVED SAMPLE/PRELOAD
001 010 011 100
RESERVED RESERVED BYPASS
101 110 111
18
PRELIMINARY
Boundary Scan Order
Bit # 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 Signal Name TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD Bump ID TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD Bit # 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 Signal Name TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD Bump ID TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD
CY7C1360V25 CY7C1362V25 CY7C1364V25
Boundary Scan Order
Bit # 33 34 35 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 Signal Name TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD Bump ID TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD Bit # 68 69 70 Signal Name TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD Bump ID TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD
19
PRELIMINARY
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature ..................................... -65C to +150C Ambient Temperature with Power Applied .................................................. -55C to +125C Supply Voltage on VDD Relative to GND .........-0.3V to +3.6V DC Voltage Applied to Outputs in High Z State[8] .....................................-0.5V to VDDQ + 0.5V DC Input Voltage[8] ..................................-0.5V to VDDQ + 0.5V
CY7C1360V25 CY7C1362V25 CY7C1364V25
Current into Outputs (LOW)......................................... 20 mA Static Discharge Voltage .......................................... >2001V (per MIL-STD-883, Method 3015) Latch-Up Current .................................................... >200 mA
Operating Range
Range Com'l Ambient Temperature[9] 0C to +70C VDD/VDDQ 2.5V 5%
Electrical Characteristics Over the Operating Range
Parameter VDD VDDQ VOH VOL VIH VIL IX IZZ IOZ IDD Description Power Supply Voltage I/O Supply Voltage Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage[8] Input Load Current except ZZ and MODE Input Current of MODE Input Current of ZZ Output Leakage Current VDD Operating Supply Current Input = VSS GND VI V DDQ, Output Disabled VDD = Max., IOUT = 0 mA, f = fMAX = 1/tCYC 5.0-ns cycle, 200 MHz 6.0-ns cycle, 166 MHz 7.5-ns cycle, 133 MHz 10-ns cycle, 100 MHz ISB1 Automatic CS Power-Down Current--TTL Inputs Max. VDD, Device Deselected, VIN V IH or VIN VIL f = fMAX = 1/tCYC 5.0-ns cycle, 200 MHz 6.0-ns cycle, 166 MHz 7.5-ns cycle, 133 MHz 10-ns cycle, 100 MHz ISB2 Automatic CS Max. VDD, Device Deselected, VIN Power-Down 0.3V or VIN > VDDQ - 0.3V, f = 0 Current--CMOS Inputs Automatic CS Max. VDD, Device Deselected, or Power-Down VIN 0.3V or VIN > VDDQ - 0.3V Current--CMOS Inputs f = fMAX = 1/tCYC 5.0-ns cycle, 200 MHz 6.0-ns cycle, 166 MHz 7.5-ns cycle, 133 MHz 10-ns cycle, 100 MHz ISB4 Automatic CS Power-Down Current--TTL Inputs Max. VDD, Device Deselected, VIN V IH or VIN VIL, f = 0 GND VI V DDQ VDD = Min., IOH = -1.0 mA VDD = Min., IOL = 1.0 mA 1.7 -0.3 -5 -30 -5 -2 2 450 400 350 325 90 80 70 65 10 Test Conditions Min. 2.375 2.375 2.0 0.2 VDD + 0.3V 0.7 5 30 Max. 2.625 2.625 Unit V V V V V V A A A A mA mA mA mA mA mA mA mA mA
ISB3
45 40 35 30 25
mA mA mA mA mA
Note: 8. Minimum voltage equals -2.0V for pulse durations of less than 20 ns. 9. TA is the temperature.
20
PRELIMINARY
Capacitance[10]
Parameter CIN CCLK CI/O Description Input Capacitance Clock Input Capacitance Input/Output Capacitance Test Conditions TA = 25C, f = 1 MHz, VDD = 2.5V, VDDQ = 2.5V Max. 4 4 4
CY7C1360V25 CY7C1362V25 CY7C1364V25
Unit pF pF pF
AC Test Loads and Waveforms[11]
OUTPUT Z0 =50 RL =50 VL = 1.25V 2.5V OUTPUT 5 pF R=1538 INCLUDING JIG AND SCOPE R=1667 ALL INPUT PULSES 2.5V 10% GND 2.5ns 90%
[10]
90% 10% 2.5ns
(a)
(b)
(c)
Note: 10. Tested initially and after any design or process changes that may affect these parameters. 11. Input waveform should have a slew rate of 1 V/ns.
21
PRELIMINARY
Switching Characteristics Over the Operating Range[12, 13, 14]
-200 Parameter tCYC tCH tCL tAS tAH tCO tDOH tADS tADH tWES tWEH tADVS tADVH tDS tDH tCES tCEH tCHZ tCLZ tEOHZ tEOLZ tEOV Clock HIGH Clock LOW Address Set-Up Before CLK Rise Address Hold After CLK Rise Data Output Valid After CLK Rise Data Output Hold After CLK Rise ADSP, ADSC Set-Up Before CLK Rise ADSP, ADSC Hold After CLK Rise BWE, GW, BWx Set-Up Before CLK Rise BWE, GW, BWx Hold After CLK Rise ADV Set-Up Before CLK Rise ADV Hold After CLK Rise Data Input Set-Up Before CLK Rise Data Input Hold After CLK Rise ChipEnable Set-Up Chip Enable Hold After CLK Rise Clock to High-Z Clock to Low-Z
[13] [13] [13, 14]
CY7C1360V25 CY7C1362V25 CY7C1364V25
-166 Min. 6.0 1.7 1.7 1.5 0.5 3.1 3.5 1.5 1.5 0.5 1.5 0.5 1.5 1.5 1.5 0.5 1.5 0.5 3.1 3.2 1.5 0 3.5 0 3.1 3.5 0 3.5 1.5 2.0 0.5 2.0 0.5 2.0 0.5 2.0 0.5 2.0 0.5 1.5 0 Max. 7.5 1.9 1.9 2.0 0.5
-133 Min. Max. 10 3.2 3.2 2.0 0.5 4.2 1.5 2.0 0.5 2.0 0.5 2.0 0.5 2.0 0.5 2.0 0.5 4.2 4.2 0 4.2 1.5 0
-100 Min. Max. Unit ns ns ns ns ns 5.0 ns ns ns ns ns ns ns ns ns ns ns ns 5.0 4.5 5.0 ns ns ns ns ns
Description Clock Cycle Time
Min. 5.0 1.6 1.6 1.5 0.5 1.0 1.5 0.5 1.5 0.5 1.5 1.5 1.5 0.5 1.5 0.5 1.5 0 0
Max.
OE HIGH to Output High-Z OE LOW to Output Valid
OE LOW to Output Low-Z[13, 14]
[13]
Notes: 12. Unless otherwise noted, test conditions assume signal transition time of 2.5 ns or less, timing reference levels of 1.25V, input pulse levels of 0 to 2.5V, and output loading of the specified I OL/IOH and load capacitance. Shown in (a), (b) and (c) of AC Test Loads. 13. t CHZ, t CLZ, tOEV, t EOLZ, and tEOHZ are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured 200 mV from steady-state voltage. 14. At any given voltage and temperature, tEOHZ is less than t EOLZ and tCHZ is less than tCLZ.
22
PRELIMINARY
1
CY7C1360V25 CY7C1362V25 CY7C1364V25
Switching Waveforms
Write Cycle Timing[15, 16]
Single Write tCH tCYC
Burst Write
Pipelined Write Unselected
CLK
tADH tADS tCL ADSP ignored with CE1 inactive
ADSP
tADS tADH
ADSC initiated write
ADSC
tADVS tADVH
ADV
tAS
ADV Must Be Inactive for ADSP Write
WD1 tAH WD2 WD3
ADD
GW
tWS tWH tWS CE1 masks ADSP tWH
WE
tCES tCEH
CE1
tCES tCEH Unselected with CE2
CE2
CE3
tCES tCEH
OE
tDS
tDH High-Z
Data- High-Z In
1a 1a
2a = UNDEFINED
2b
2c
2d
3a
= DON'T CARE
Notes: 15. WE is the combination of BWE, BWx, and GW to define a write cycle (see Write Cycle Description table). 16. WDx stands for Write Data to Address X.
23
PRELIMINARY
Switching Waveforms (continued)
Read Cycle Timing[15, 17]
CY7C1360V25 CY7C1362V25 CY7C1364V25
Single Read tCYC
Burst Read tCH Pipelined Read
Unselected
CLK
tADS tADH tCL ADSP ignored with CE1 inactive
ADSP
tADS ADSC initiated read
ADSC
tADVS tADH tADVH RD1 tAH RD2 RD3 Suspend Burst
ADV
tAS
ADD
GW
tWS
tWH
tWS
WE
tCES tCEH tWH CE1 masks ADSP
CE1
Unselected with CE2
CE2
tCES tCEH
CE3
tCES tCEH tEOV tOEHZ tDOH tCO
OE
Data Out
1a 1a tCLZ
2a
2b
2c 2c
2d
3a tCHZ
= DON'T CARE
Note: 17. RDx stands for Read Data from Address X.
= UNDEFINED
24
PRELIMINARY
Switching Waveforms (continued)
Read/Write Cycle Timing[15, 16, 17]
CY7C1360V25 CY7C1362V25 CY7C1364V25
Single Read tCYC
Single Write tCH
Burst Read Pipelined Read
Unselected
CLK
tADS tADH tCL ADSP ignored with CE1 inactive
ADSP
tADS
ADSC
tADVS tADH
ADV
tAS tADVH RD1 tAH WD2 RD3
ADD
GW
tWS tWH
tWS
WE
tCES tCEH tWH CE1 masks ADSP
CE1
CE2
tCES tCEH
CE3
tCES tCEH tEOV tEOHZ
OE
tDS 2a Out 3a Out tDH 3b Out 3c Out tDOH 3d Out tCHZ tEOLZ tCO
Data In/Out
1a 1a Out
2a In = DON'T CARE
= UNDEFINED
25
PRELIMINARY
Switching Waveforms (continued)
Pipeline Timing[18, 19] tCH tCYC tCL
CY7C1360V25 CY7C1362V25 CY7C1364V25
CLK
tAS
ADD
RD1
RD2
RD3
RD4
WD1
WD2
WD3
WD4
tADS
ADSC initiated Reads
tADH
ADSC
ADSP initiated Reads
ADSP
ADV
tCES tCEH
CE1
CE
tWES tWEH
WE
ADSP ignored with CE1 HIGH
OE
tCLZ
Data In/Out
tCDV
1a Out
2a Out
3a Out
4a Out
1a In
2a In tDOH
3a In
4a D(C) In
Back to Back Reads = DON'T CARE
tCHZ = UNDEFINED
Notes: 18. Device originally deselected. 19. CE is the combination of CE2 and CE3. All chip selects need to be active in order to select the device.
26
PRELIMINARY
Switching Waveforms (continued)
OE Switching Waveforms
CY7C1360V25 CY7C1362V25 CY7C1364V25
OE
tEOHZ tEOV
I/Os
Three-State
tEOLZ
27
PRELIMINARY
Switching Waveforms (continued)
ZZ Mode Timing [20, 21]
CY7C1360V25 CY7C1362V25 CY7C1364V25
CLK
ADSP
HIGH
ADSC CE1
LOW
CE2
HIGH
CE3
ZZ
tZZS
IDD
IDD(active) IDDZZ
tZZREC
I/O's Three-state
NotefjdfdhfdjfdfjdjdjdjNo
Note: 20. Device must be deselected when entering ZZ mode. See Cycle Description Table for all possible signal conditions to deselect the device. 21. I/Os are in three-state when exiting ZZ sleep mode.
28
PRELIMINARY
Ordering Information
Speed (MHz) 200 166 133 100 200 166 133 100 200 166 133 100 200 166 133 100 200 166 133 100 200 166 133 100 Ordering Code CY7C1360V25-200AC CY7C1360V25-166AC CY7C1360V25-133AC CY7C1360V25-100AC CY7C1362V25-200AC CY7C1362V25-166AC CY7C1362V25-133AC CY7C1362V25-100AC CY7C1364V25-200AC CY7C1364V25-166AC CY7C1364V25-133AC CY7C1364V25-100AC CY7C1360V25-200BGC CY7C1360V25-166BGC CY7C1360V25-133BGC CY7C1360V25-100BGC CY7C1362V25-200BGC CY7C1362V25-166BGC CY7C1362V25-133BGC CY7C1362V25-100BGC CY7C1364V25-200BGC CY7C1364V25-166BGC CY7C1364V25-133BGC CY7C1364V25-100BGC BG119 119-Ball (14 x 22 x 2.4 mm) BGA BG119 119-Ball (14 x 22 x 2.4 mm) BGA BG119 119-Ball (14 x 22 x 2.4 mm) BGA A101 100-Lead Thin Quad Flat Pack A101 100-Lead Thin Quad Flat Pack Package Name A101 Package Type 100-Lead Thin Quad Flat Pack
CY7C1360V25 CY7C1362V25 CY7C1364V25
Operating Range Commercial
Commercial
Commercial
Commercial
Commercial
Commercial
Document #:38-00760-A
29
PRELIMINARY
CY7C1360V25 CY7C1362V25 CY7C1364V25
Package Diagrams
100-Pin Thin Plastic Quad Flatpack (14 x 20 x 1.4 mm) A101
51-85050-A
30
PRELIMINARY
Package Diagrams (continued)
119-Lead FBGA (14 x 22 x 2.4 mm) BG119
CY7C1360V25 CY7C1362V25 CY7C1364V25
51-85115
Revision History
Document Title: CY7C1360V25/CY7C1362V25/CY7C1364V25 Document Number: 38-00760 REV. ** *A ECN NO. 2560 2683 ISSUE DATE 4/29/99 9/10/99 ORIG. OF CHANGE SKX SKX DESCRIPTION OF CHANGE 1. New Datasheet 1. Updated the BGA pinout 2. Added revision history
(c) Cypress Semiconductor Corporation, 1999. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.

▲Up To Search▲

Price & Availability of CY7C1360V25

	To Download CY7C1360V25 Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .